Nearfield Instruments
The company develops automated high-throughput 3D scanning probe metrology systems for the high-end nano-electronics industry. Its primary product, QUADRA, utilizes atomic force microscopy to enable atom-scale resolution 3D metrology for semiconductor process control. These solutions address challenges in advanced integrated circuit manufacturing, including sidewall imaging and critical dimension measurement.
Visit websiteRotterdam, Netherlands
Semiconductors
Deep Tech
Nano-electronics
Metrology
Funding summary
- Total raised
- €524.2M
- Funding rounds
- 6
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